|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 4 of 31 found articles
| Title: |
Benchmarks of a III-V TFET technology platform against the 10-nm CMOS FinFET technology node considering basic arithmetic circuits |
| Author: |
Strangio, S. Palestri, P. Lanuzza, M. Esseni, D. Crupi, F. Selmi, L. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 128 (2017) nr. C pages 6 p. |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 31 found articles
| << previous | next >> |