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                                       Details for article 29 of 31 found articles
 
 
  Systematic method for electrical characterization of random telegraph noise in MOSFETs
 
 
Title: Systematic method for electrical characterization of random telegraph noise in MOSFETs
Author: Marquez, Carlos
Rodriguez, Noel
Gamiz, Francisco
Ohata, Akiko
Appeared in: Solid-state electronics
Paging: Volume 128 (2017) nr. C pages 6 p.
Year: 2017
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 29 of 31 found articles
 
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