Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers
Titel:
Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers
Auteur:
Damianos, D. Pirro, L. Soylu, G. Ionica, I. Nguyen, V. Vitrant, G. Kaminski, A. Blanc-Pelissier, D. Onestas, L. Changala, J. Kryger, M. Cristoloveanu, S.