|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 9 of 11 found articles
| Title: |
Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation |
| Author: |
Kao, Tsung-Hsien Chang, Shoou-Jinn Fang, Yean-Kuen Huang, Po-Chin Wang, Bo-Chin Wu, Chung-Yi Wu, San-Lein |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 115 (2016) nr. PA pages 5 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 11 found articles
| << previous | next >> |