|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 7 of 33 found articles
| Title: |
Bias temperature instability comparison of CMOS LTPS-TFTs with HfO2 gate dielectric |
| Author: |
Ma, William Cheng-Yu Huang, Chi-Yuan |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 114 (2015) nr. C pages 6 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 33 found articles
| << previous | next >> |