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Journal description
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Details for article 9 of 14 found articles
| Title: |
Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy |
| Author: |
Achour, H. Cretu, B. Simoen, E. Routoure, J.-M. Carin, R. Benfdila, A. Aoulaiche, M. Claeys, C. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 112 (2015) nr. C pages 6 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 14 found articles
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