|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 16 of 18 found articles
| Title: |
Study on interface characteristics in amorphous indium–gallium–zinc oxide thin-film transistors by using low-frequency noise and temperature dependent mobility measurements |
| Author: |
Wu, Chenfei Huang, Xiaoming Lu, Hai Yu, Guang Ren, Fangfang Chen, Dunjun Zhang, Rong Zheng, Youdou |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 109 (2015) nr. C pages 5 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 18 found articles
| << previous | next >> |