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Journal description
All volumes of the corresponding journal
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Details for article 11 of 24 found articles
| Title: |
Degradation of 4H-SiC IGBT threshold characteristics due to SiC/SiO2 interface defects |
| Author: |
Pesic, Iliya Navarro, Dondee Miyake, Masataka Miura-Mattausch, Mitiko |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 101 (2014) nr. C pages 5 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 24 found articles
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