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                                       Details for article 56 of 74 found articles
 
 
  On the scaling limits of low-frequency noise in SiGe HBTs
 
 
Title: On the scaling limits of low-frequency noise in SiGe HBTs
Author: Johansen, Jarle A.
Jin, Zhenrong
Cressler, John D.
Cui, Yan
Niu, Guofu
Liang, Qingqing
Rieh, Jae-Sung
Freeman, Greg
Ahlgren, Dave
Joseph, Alvin
Appeared in: Solid-state electronics
Paging: Volume 48 (2004) nr. 10-11 pages 4 p.
Year: 2004
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 56 of 74 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands