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                                       Details for article 47 of 74 found articles
 
 
  Modeling of direct tunneling current through interfacial oxide and high-K gate stacks
 
 
Title: Modeling of direct tunneling current through interfacial oxide and high-K gate stacks
Author: Zhao, Yijie
White, Marvin H.
Appeared in: Solid-state electronics
Paging: Volume 48 (2004) nr. 10-11 pages 7 p.
Year: 2004
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 47 of 74 found articles
 
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