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Details for article 20 of 74 found articles
| Title: |
Characterization of moving bits (MBs) and QBD in wet/dry tunnel oxides for floating gate type nonvolatile memory (FG-NVM) applications |
| Author: |
Ackaert, Jan Lowe, Antony Boonen, Sylvie Yao, Thierry Rayhem, Joseph Desoete, Bart Prasad, Jagdish Thomason, Mike Van Houdt, Jan Degraeve, Robin Haspeslagh, Luc Hendrickx, Paul |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 48 (2004) nr. 10-11 pages 5 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 74 found articles
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