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                                       Details for article 94 of 94 found articles
 
 
  X-ray photoelectron spectroscopy characterization of stain-etched luminescent porous silicon films
 
 
Title: X-ray photoelectron spectroscopy characterization of stain-etched luminescent porous silicon films
Author: Zanoni, R
Righini, G
Mattogno, G
Schirone, L
Sotgiu, G
Rallo, F
Appeared in: Journal of luminescence
Paging: Volume 80 (1998) nr. 1-4 pages 4 p.
Year: 1998
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 94 of 94 found articles
 
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