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Journal description
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Details for article 12 of 94 found articles
| Title: |
Comparative study of the oxidation of thin porous silicon layers studied by reflectometry, spectroscopic ellipsometry and secondary ion mass spectroscopy |
| Author: |
Fried, M Polgár, O Lohner, T Strehlke, S Levy-Clement, C |
| Appeared in: |
Journal of luminescence |
| Paging: | Volume 80 (1998) nr. 1-4 pages 6 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 94 found articles
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