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Journal description
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Details for article 51 of 54 found articles
| Title: |
Transmission electron microscopy study of defect reduction in two-step lateral epitaxial overgrown nonplanar GaN substrate templates |
| Author: |
Zhou, Wei Ren, Dawei Dapkus, P.D. |
| Appeared in: |
Journal of crystal growth |
| Paging: | Volume 290 (2006) nr. 1 pages 7 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 51 of 54 found articles
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