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Journal description
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Details for article 73 of 137 found articles
| Title: |
In situ stress measurements during MOCVD growth of AlGaN on SiC |
| Author: |
Acord, Jeremy D. Raghavan, Srinivasan Snyder, David W. Redwing, Joan M. |
| Appeared in: |
Journal of crystal growth |
| Paging: | Volume 272 (2004) nr. 1-4 pages 7 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 73 of 137 found articles
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