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Details for article 1 of 11 found articles
| Title: |
Analysis of the false-positive error rate of tagged fragment marking scheme |
| Author: |
Hwang, Jinsoo Kim, Jeankyung Kim, Kichang |
| Appeared in: |
Information processing letters |
| Paging: | Volume 112 (2012) nr. 6 pages 6 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 11 found articles
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