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Journal description
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Details for article 15 of 15 found articles
| Title: |
Resonance Raman scattering and scanning tunneling spectroscopy of CdS thin films grown by electrochemical atomic layer epitaxy—thickness dependent phonon and electronic properties |
| Author: |
Gichuhi, Anthony Boone, B.Edward Shannon, Curtis |
| Appeared in: |
Journal of electroanalytical chemistry |
| Paging: | Volume 522 (2002) nr. 1 pages 5 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 15 found articles
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