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Journal description
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Details for article 20 of 31 found articles
| Title: |
Micromorphology changes of silicon oxide on Si(111) during current oscillations: a comparative in situ AFM and FTIR study |
| Author: |
Nast, Oliver Rauscher, Stefan Jungblut, Helmut Lewerenz, Hans-Joachim |
| Appeared in: |
Journal of electroanalytical chemistry |
| Paging: | Volume 442 (1998) nr. 1-2 pages 6 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science S.A. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 31 found articles
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