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Journal description
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Details for article 21 of 22 found articles
| Title: |
The scanning microscope for semiconductor characterization (SMSC): Comparative study of the influence of surface defects on the photoelectrochemical behavior of n-WSe2 and n-MoSe2 layered compounds |
| Author: |
Chaparro, A.M. Salvador, P. Mir, A. |
| Appeared in: |
Journal of electroanalytical chemistry |
| Paging: | Volume 411 (1996) nr. 1-2 pages 7 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Elsevier Science S.A. All rights reserved |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 22 found articles
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