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Journal description
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Details for article 18 of 19 found articles
| Title: |
Thickness uniformity check of electropolymerized thin films by means of small area XPS |
| Author: |
Delamar, Michel Dubois, Jacques-Emile |
| Appeared in: |
Journal of electroanalytical chemistry |
| Paging: | Volume 184 (1985) nr. 1 pages 4 p. |
| Year: |
1985 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 19 found articles
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