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Journal description
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Details for article 10 of 26 found articles
| Title: |
Ellipsometry: The effect of atomic roughness on the optical properties of gold electrodes covered with a monolayer of thallium |
| Author: |
Chao, F. Costa, M. |
| Appeared in: |
Journal of electroanalytical chemistry |
| Paging: | Volume 119 (1981) nr. 2 pages 3 p. |
| Year: |
1981 |
| Contents: | |
| Publisher: |
Elsevier Sequoia S.A. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 26 found articles
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