|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 12 found articles
| Title: |
An improved methodology for high-resolution LA-ICP-MS trace-element fingerprinting of tephra layers: Insights from the Upper and Lower Nariokotome Tuffs, Turkana Basin, Kenya |
| Author: |
Samim, Saini Dalton, Hayden Hergt, Janet Greig, Alan Phillips, David |
| Appeared in: |
Chemical geology |
| Paging: | Volume 660 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 12 found articles
| << previous | next >> |