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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 12 found articles
| Title: |
Crack detection in single-crystalline silicon wafers using impact testing |
| Author: |
Hilmersson, C. Hess, D.P. Dallas, W. Ostapenko, S. |
| Appeared in: |
Applied acoustics |
| Paging: | Volume 69 (2008) nr. 8 pages 6 p. |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 12 found articles
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