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                                       Details for article 34 of 56 found articles
 
 
  Mixed-mode crack initiation at the edge of Cu/Si interface due to nanoscale stress concentration
 
 
Title: Mixed-mode crack initiation at the edge of Cu/Si interface due to nanoscale stress concentration
Author: Kishimoto, Kohei
Yan, Yabin
Sumigawa, Takashi
Kitamura, Takayuki
Appeared in: Engineering fracture mechanics
Paging: Volume 96 (2012) nr. C pages 10 p.
Year: 2012
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 34 of 56 found articles
 
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