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  Application of virtual crack closure integral method for interface cracks in low-k integrated circuit devices under thermal load
 
 
Title: Application of virtual crack closure integral method for interface cracks in low-k integrated circuit devices under thermal load
Author: Zhao, Jie-Hua
Appeared in: Engineering fracture mechanics
Paging: Volume 72 (2005) nr. 9 pages 22 p.
Year: 2005
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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