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                                       Details for article 15 of 80 found articles
 
 
  Atomic scale analysis of cracking behavior at the triple junctions based on molecular dynamics simulations
 
 
Title: Atomic scale analysis of cracking behavior at the triple junctions based on molecular dynamics simulations
Author: Zhang, Xiang
Li, Puhao
Liu, Yaping
Zhang, Mengfei
Yang, Fan
Appeared in: Engineering fracture mechanics
Paging: Volume 314 () nr. C pages p.
Year: 2025
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 15 of 80 found articles
 
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