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                                       Details for article 44 of 45 found articles
 
 
  The use of AFM in assessing the crack resistance of silicon wafers of various orientations
 
 
Title: The use of AFM in assessing the crack resistance of silicon wafers of various orientations
Author: Lapitskaya, Vasilina A.
Kuznetsova, Tatyana A.
Khabarava, Anastasiya V.
Chizhik, Sergei A.
Aizikovich, Sergei M.
Sadyrin, Evgeniy V.
Mitrin, Boris I.
Sun, Weifu
Appeared in: Engineering fracture mechanics
Paging: Volume 259 () nr. C pages p.
Year: 2022
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 44 of 45 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands