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Journal description
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Details for article 16 of 27 found articles
| Title: |
Full-field identification of mixed-mode adhesion properties in a flexible, multi-layer microelectronic material system |
| Author: |
Ruybalid, A.P. van der Sluis, O. Geers, M.G.D. Hoefnagels, J.P.M. |
| Appeared in: |
Engineering fracture mechanics |
| Paging: | Volume 226 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 27 found articles
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