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Journal description
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Details for article 20 of 28 found articles
| Title: |
Mixed-mode cohesive zone parameters for sub-micron scale stacked layers to predict microelectronic device reliability |
| Author: |
Raghavan, Sathyanarayanan Schmadlak, Ilko Leal, George Sitaraman, Suresh K. |
| Appeared in: |
Engineering fracture mechanics |
| Paging: | Volume 153 (2016) nr. C pages 19 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 28 found articles
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