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Journal description
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Details for article 8 of 17 found articles
| Title: |
Development of single cantilever beam method to measure the adhesion of thin film adhesive on silicon chip |
| Author: |
Shin, DongKil Lee, JungJu Yoon, ChulKeun Lee, GyuJei Hong, JoonKi Kim, NamSuk |
| Appeared in: |
Engineering fracture mechanics |
| Paging: | Volume 133 (2015) nr. C pages 179-190 |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 17 found articles
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