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                                       Details for article 21 of 45 found articles
 
 
  Influence of post fabrication annealing on device performance of InAlN/GaN high electron mobility transistors
 
 
Title: Influence of post fabrication annealing on device performance of InAlN/GaN high electron mobility transistors
Author: Luo, Xin
Cui, Peng
Linewih, Handoko
Cheong, Kuan Yew
Xu, Mingsheng
Chen, Siheng
Wang, Liu
Sun, Jiuji
Dai, Jiacheng
Xu, Xiangang
Han, Jisheng
Appeared in: Journal of physics and chemistry of solids
Paging: Volume 187 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 21 of 45 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands