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                                       Details for article 4 of 10 found articles
 
 
  A phase field model for failure in interconnect lines due to coupled diffusion mechanisms
 
 
Title: A phase field model for failure in interconnect lines due to coupled diffusion mechanisms
Author: Bhate, Deepali N.
Bower, Allan F.
Kumar, Ashish
Appeared in: Journal of the mechanics and physics of solids
Paging: Volume 50 (2002) nr. 10 pages 27 p.
Year: 2002
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 10 found articles
 
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