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Journal description
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Details for article 19 of 42 found articles
| Title: |
Generalised residual stress depth profiling at the nanoscale using focused ion beam milling |
| Author: |
Salvati, E. Romano-Brandt, L. Mughal, M.Z. Sebastiani, M. Korsunsky, A.M. |
| Appeared in: |
Journal of the mechanics and physics of solids |
| Paging: | Volume 125 () nr. C pages 488-501 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 42 found articles
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