|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 86 of 92 found articles
| Title: |
Surface-enhanced Raman spectroscopy as an in-situ real-time probe of no reduction over rhodium at high gas pressures |
| Author: |
Williams, Christopher T. Tolia, Anish A. Weaver, Michael J. Takoudis, Christos G. |
| Appeared in: |
Chemical engineering science |
| Paging: | Volume 51 (1996) nr. 10 pages 10 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 86 of 92 found articles
| << previous | next >> |