Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy
Titel:
Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy
Auteur:
Reddy, Steven M. van Riessen, Arie Saxey, David W. Johnson, Tim E. Rickard, William D.A. Fougerouse, Denis Fischer, Sebastian Prosa, Ty J. Rice, Katherine P. Reinhard, David A. Chen, Yimeng Olson, David