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Journal description
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Details for article 1 of 23 found articles
| Title: |
A light reflectance technique for thickness measurements of passive films |
| Author: |
Büchler, M. Schmuki, P. Böhni, H. |
| Appeared in: |
Electrochimica acta |
| Paging: | Volume 43 (1998) nr. 5-6 pages 3 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 23 found articles
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