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                                       Details for article 8 of 53 found articles
 
 
  Characterization of the porosity of silicon nitride thin layers by Electrochemical Impedance Spectroscopy
 
 
Title: Characterization of the porosity of silicon nitride thin layers by Electrochemical Impedance Spectroscopy
Author: Barrès, T.
Tribollet, B.
Stephan, O.
Montigaud, H.
Boinet, M.
Cohin, Y.
Appeared in: Electrochimica acta
Paging: Volume 227 (2017) nr. C pages 1-6
Year: 2017
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 53 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands