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                                       Details for article 16 of 120 found articles
 
 
  Characterizing local structure of SiOx using confocal μ-Raman spectroscopy and its effects on electrochemical property
 
 
Title: Characterizing local structure of SiOx using confocal μ-Raman spectroscopy and its effects on electrochemical property
Author: Yoo, Sunyoung
Kim, JeongHan
Kang, Byoungwoo
Appeared in: Electrochimica acta
Paging: Volume 212 (2016) nr. C pages 68-75
Year: 2016
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 120 found articles
 
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