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                                       Details for article 5 of 16 found articles
 
 
  A Switch from High-Fidelity to Error-Prone DNA Double-Strand Break Repair Underlies Stress-Induced Mutation
 
 
Title: A Switch from High-Fidelity to Error-Prone DNA Double-Strand Break Repair Underlies Stress-Induced Mutation
Author: Ponder, Rebecca G.
Fonville, Natalie C.
Rosenberg, Susan M.
Appeared in: Molecular cell
Paging: Volume 19 (2005) nr. 6 pages 14 p.
Year: 2005
Contents:
Publisher: Elsevier Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5 of 16 found articles
 
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