| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An exact two-sample test based on the baumgartner-weiss-schindler statistic and a modification of lepage's test
|
Neuhauser, Markus
|
|
2000
|
29 |
1 |
p. 67-78
|
artikel
|
| 2 |
A unified approach to estimating association measures via a joint generalized linear model for paired binary data
|
Qu, Yinsheng
|
|
2000
|
29 |
1 |
p. 143-156
|
artikel
|
| 3 |
Bayes estimation of intraclass correlation coefficient
|
Bhandary, Madhusudin K.
|
|
2000
|
29 |
1 |
p. 79-93
|
artikel
|
| 4 |
Bootstrap confidence intervals for the pareto index
|
Guillou, Armelle
|
|
2000
|
29 |
1 |
p. 211-226
|
artikel
|
| 5 |
Comparison of linex and quadratic bayes estimators foe the rayleigh distribution
|
Soliman, Ahmed A.
|
|
2000
|
29 |
1 |
p. 95-107
|
artikel
|
| 6 |
Editorial
|
Smith, William B.
|
|
2000
|
29 |
1 |
p. 5-6
|
artikel
|
| 7 |
Editorial board
|
|
|
2000
|
29 |
1 |
p. 1
|
artikel
|
| 8 |
Inference with overlapping 2×2 tables
|
Smith, William B.
|
|
2000
|
29 |
1 |
p. 237-241
|
artikel
|
| 9 |
Notes on likelihood intervals and profiling
|
Quinn, Shannon L.
|
|
2000
|
29 |
1 |
p. 109-129
|
artikel
|
| 10 |
On confidence limits for the difference of two binomial parameters
|
Feigin, Paul D.
|
|
2000
|
29 |
1 |
p. 131-141
|
artikel
|
| 11 |
On robust estimation in the first order autoregressive processes
|
Haddad, John N.
|
|
2000
|
29 |
1 |
p. 45-54
|
artikel
|
| 12 |
Optimality of the posterior predictive p-value based on the posterior. Odds
|
de la Horra, Julian
|
|
2000
|
29 |
1 |
p. 181-192
|
artikel
|
| 13 |
Restricted alternatives tests in a bivariate exponential model with covariates
|
Wada, Cicilia Y.
|
|
2000
|
29 |
1 |
p. 193-210
|
artikel
|
| 14 |
Robust estimation for the coefficient of a first order autoregressive process
|
Guo, Jiin-Huarng
|
|
2000
|
29 |
1 |
p. 55-66
|
artikel
|
| 15 |
Small sample set estimation of a baseline ranking
|
Keison, P.I.
|
|
2000
|
29 |
1 |
p. 19-43
|
artikel
|
| 16 |
Tables of the cramer-von mises distributions
|
Scott, W.F.
|
|
2000
|
29 |
1 |
p. 227-235
|
artikel
|
| 17 |
Tests for exponentiality against new better than old in expectation and new better than some used in expectation alternatives
|
Sen, Kanwar
|
|
2000
|
29 |
1 |
p. 157-180
|
artikel
|
| 18 |
Use of contagious distributions in the semiconductor yield models considering cluster effect
|
Park, Kwang-Su
|
|
2000
|
29 |
1 |
p. 1-17
|
artikel
|
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