Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             27 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A new method for analysing peak broadening caused by compositional fluctuation in X-ray diffraction measurements Nakashima, Kiichi
2001
34 6 p. 681-690
artikel
2 A random procedure for the decomposition of a powder pattern in EXPO Altomare, Angela
2001
34 6 p. 704-709
artikel
3 Controllable variation of the intensity of diffracted X-ray beams and double modulation of such beams for transmission and reception of audio information Navasardyan, M. A.
2001
34 6 p. 763-766
artikel
4 Determination of γ′ solution temperature in Re-rich Ni-base superalloy by small-angle neutron scattering. Erratum Strunz, Pavel
2001
34 6 p. 787
artikel
5 Direct determination of microstructural parameters from the X-ray diffraction profile of a crystal with stacking faults Estevez-Rams, Ernesto
2001
34 6 p. 730-736
artikel
6 From molecules to crystallizers. An introduction to crystallization. By Roger Davey and John Garside. Pp. ii + 81. New York, Oxford University Press, 2001. Price $12.95 (paper). ISBN 0-19-850489-6. 2001
34 6 p. 787
artikel
7 Iterative unfolding of two-dimensional data by Siska's method Wieder, Thomas
2001
34 6 p. 786
artikel
8 MCGRtof: Monte Carlo G(r) with resolution corrections for time-of-flight neutron diffractometers Tucker, Matthew G.
2001
34 6 p. 780-782
artikel
9 Measurement of subtle strain modifications in heterostructures by using X-ray mapping in reciprocal space Shilo, D.
2001
34 6 p. 715-721
artikel
10 NADA – a computer program for the simultaneous refinement of orientation matrix and modulation vector(s) Schönleber, Andreas
2001
34 6 p. 777-779
artikel
11 New analytical software for XRD simplifies identification of complex phase mixtures 2001
34 6 p. 788
artikel
12 New 9308-PCI picosecond time analyzer with PCI-bus interface 2001
34 6 p. 788
artikel
13 New X-ray Hystar range of high-performance image detectors 2001
34 6 p. 788
artikel
14 Orthorhombic lattice deformation of CuAlBe shape-memory single crystals under cyclic strain Eberhardt, A.
2001
34 6 p. 722-729
artikel
15 Planar faults in layered Bi-containing perovskites studied by X-ray diffraction line profile analysis Boulle, A.
2001
34 6 p. 699-703
artikel
16 PSEUDO: a program for a pseudo­symmetry search Kroumova, E.
2001
34 6 p. 783-784
artikel
17 Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data Ballirano, Paolo
2001
34 6 p. 757-762
artikel
18 Robust Rietveld refinement in the presence of impurity phases David, W. I. F.
2001
34 6 p. 691-698
artikel
19 Salts of aromatic carboxylates: the crystal structures of nickel(II) and cobalt(II) 2,6-naphthalenedicarboxylate tetrahydrate Kaduk, James A.
2001
34 6 p. 710-714
artikel
20 Scattering curve and radius of gyration of a straight chain of identical spheres Kawaguchi, Takeshi
2001
34 6 p. 771-772
artikel
21 Teaching diffraction using computer simulations over the Internet Proffen, Th.
2001
34 6 p. 767-770
artikel
22 The crystal lattice: phonons, solitons, dislocations. By Arnold M. Kossevich. Pp. 326. Berlin: Wiley-VCH Verlag, 1999. Price DM 248.00, EUR 126.80. ISBN 3-527-40220-9. 2001
34 6 p. 787
artikel
23 The precision of diffraction peak location Daymond, Mark R.
2001
34 6 p. 737-743
artikel
24 Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders Poulsen, H. F.
2001
34 6 p. 751-756
artikel
25 Tracking: a method for structural characterization of grains in powders or polycrystals Lauridsen, E. M.
2001
34 6 p. 744-750
artikel
26 Using Situs for the registration of protein structures with low-resolution bead models from X-ray solution scattering Wriggers, Willy
2001
34 6 p. 773-776
artikel
27 xd_red-1.0: synchrotron and in-house X-ray diffraction data reduction and analysis program Mathiesen, Ragnvald H.
2001
34 6 p. 785
artikel
                             27 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland