nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A new method for analysing peak broadening caused by compositional fluctuation in X-ray diffraction measurements
|
Nakashima, Kiichi |
|
2001 |
34 |
6 |
p. 681-690 |
artikel |
2 |
A random procedure for the decomposition of a powder pattern in EXPO
|
Altomare, Angela |
|
2001 |
34 |
6 |
p. 704-709 |
artikel |
3 |
Controllable variation of the intensity of diffracted X-ray beams and double modulation of such beams for transmission and reception of audio information
|
Navasardyan, M. A. |
|
2001 |
34 |
6 |
p. 763-766 |
artikel |
4 |
Determination of γ′ solution temperature in Re-rich Ni-base superalloy by small-angle neutron scattering. Erratum
|
Strunz, Pavel |
|
2001 |
34 |
6 |
p. 787 |
artikel |
5 |
Direct determination of microstructural parameters from the X-ray diffraction profile of a crystal with stacking faults
|
Estevez-Rams, Ernesto |
|
2001 |
34 |
6 |
p. 730-736 |
artikel |
6 |
From molecules to crystallizers. An introduction to crystallization. By Roger Davey and John Garside. Pp. ii + 81. New York, Oxford University Press, 2001. Price $12.95 (paper). ISBN 0-19-850489-6.
|
|
|
2001 |
34 |
6 |
p. 787 |
artikel |
7 |
Iterative unfolding of two-dimensional data by Siska's method
|
Wieder, Thomas |
|
2001 |
34 |
6 |
p. 786 |
artikel |
8 |
MCGRtof: Monte Carlo G(r) with resolution corrections for time-of-flight neutron diffractometers
|
Tucker, Matthew G. |
|
2001 |
34 |
6 |
p. 780-782 |
artikel |
9 |
Measurement of subtle strain modifications in heterostructures by using X-ray mapping in reciprocal space
|
Shilo, D. |
|
2001 |
34 |
6 |
p. 715-721 |
artikel |
10 |
NADA – a computer program for the simultaneous refinement of orientation matrix and modulation vector(s)
|
Schönleber, Andreas |
|
2001 |
34 |
6 |
p. 777-779 |
artikel |
11 |
New analytical software for XRD simplifies identification of complex phase mixtures
|
|
|
2001 |
34 |
6 |
p. 788 |
artikel |
12 |
New 9308-PCI picosecond time analyzer with PCI-bus interface
|
|
|
2001 |
34 |
6 |
p. 788 |
artikel |
13 |
New X-ray Hystar range of high-performance image detectors
|
|
|
2001 |
34 |
6 |
p. 788 |
artikel |
14 |
Orthorhombic lattice deformation of CuAlBe shape-memory single crystals under cyclic strain
|
Eberhardt, A. |
|
2001 |
34 |
6 |
p. 722-729 |
artikel |
15 |
Planar faults in layered Bi-containing perovskites studied by X-ray diffraction line profile analysis
|
Boulle, A. |
|
2001 |
34 |
6 |
p. 699-703 |
artikel |
16 |
PSEUDO: a program for a pseudosymmetry search
|
Kroumova, E. |
|
2001 |
34 |
6 |
p. 783-784 |
artikel |
17 |
Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data
|
Ballirano, Paolo |
|
2001 |
34 |
6 |
p. 757-762 |
artikel |
18 |
Robust Rietveld refinement in the presence of impurity phases
|
David, W. I. F. |
|
2001 |
34 |
6 |
p. 691-698 |
artikel |
19 |
Salts of aromatic carboxylates: the crystal structures of nickel(II) and cobalt(II) 2,6-naphthalenedicarboxylate tetrahydrate
|
Kaduk, James A. |
|
2001 |
34 |
6 |
p. 710-714 |
artikel |
20 |
Scattering curve and radius of gyration of a straight chain of identical spheres
|
Kawaguchi, Takeshi |
|
2001 |
34 |
6 |
p. 771-772 |
artikel |
21 |
Teaching diffraction using computer simulations over the Internet
|
Proffen, Th. |
|
2001 |
34 |
6 |
p. 767-770 |
artikel |
22 |
The crystal lattice: phonons, solitons, dislocations. By Arnold M. Kossevich. Pp. 326. Berlin: Wiley-VCH Verlag, 1999. Price DM 248.00, EUR 126.80. ISBN 3-527-40220-9.
|
|
|
2001 |
34 |
6 |
p. 787 |
artikel |
23 |
The precision of diffraction peak location
|
Daymond, Mark R. |
|
2001 |
34 |
6 |
p. 737-743 |
artikel |
24 |
Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders
|
Poulsen, H. F. |
|
2001 |
34 |
6 |
p. 751-756 |
artikel |
25 |
Tracking: a method for structural characterization of grains in powders or polycrystals
|
Lauridsen, E. M. |
|
2001 |
34 |
6 |
p. 744-750 |
artikel |
26 |
Using Situs for the registration of protein structures with low-resolution bead models from X-ray solution scattering
|
Wriggers, Willy |
|
2001 |
34 |
6 |
p. 773-776 |
artikel |
27 |
xd_red-1.0: synchrotron and in-house X-ray diffraction data reduction and analysis program
|
Mathiesen, Ragnvald H. |
|
2001 |
34 |
6 |
p. 785 |
artikel |