| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Absolute structures: is your diffractometer right-handed?
|
Le Page, Y.
|
|
1991
|
24 |
1 |
p. 63
|
artikel
|
| 2 |
Absorption contrast effects in the quantitative XRD analysis of powders by full multiphase profile refinement
|
Taylor, J. C.
|
|
1991
|
24 |
1 |
p. 14-17
|
artikel
|
| 3 |
A multimode high-angular-resolution powder diffractometer
|
Kurahashi, M.
|
|
1991
|
24 |
1 |
p. 61-63
|
artikel
|
| 4 |
A simple densitometer for X-ray powder photographs
|
Calos, N. J.
|
|
1991
|
24 |
1 |
p. 72-73
|
artikel
|
| 5 |
A study of the breakdown of Friedel's law in electron backscatter Kikuchi diffraction patterns: application to zincblende-type structures
|
Baba-Kishi, K. Z.
|
|
1991
|
24 |
1 |
p. 38-47
|
artikel
|
| 6 |
Crystallographers
|
|
|
1991
|
24 |
1 |
p. 77-78
|
artikel
|
| 7 |
E.s.d.'s and estimated probable error obtained in Rietveld refinements with local correlations
|
Bérar, J.-F.
|
|
1991
|
24 |
1 |
p. 1-5
|
artikel
|
| 8 |
High-resolution small-angle X-ray scattering camera for anomalous scattering
|
Long, G. G.
|
|
1991
|
24 |
1 |
p. 30-37
|
artikel
|
| 9 |
Localization of impurity atoms in garnet cystals by the double-channel X-ray standing-wave method
|
Mukhamedzhanov, E. Kh.
|
|
1991
|
24 |
1 |
p. 6-13
|
artikel
|
| 10 |
New Commercial Products
|
|
|
1991
|
24 |
1 |
p. 78
|
artikel
|
| 11 |
POWABS: a computer program for the automatic determination of reflection conditions in powder diffraction patterns
|
Byrom, P. G.
|
|
1991
|
24 |
1 |
p. 70-72
|
artikel
|
| 12 |
Restrained refinement and results analysis for incommensurate crystal structures
|
Paciorek, W. A.
|
|
1991
|
24 |
1 |
p. 66-70
|
artikel
|
| 13 |
The application of synchrotron X-radiation for the study of phase transitions in lipid model membrane systems
|
Lis, L. J.
|
|
1991
|
24 |
1 |
p. 48-60
|
artikel
|
| 14 |
The influence of laser radiation on X-ray diffraction in ferroelectric crystals with nonlinear optical properties
|
Zhukov, S. G.
|
|
1991
|
24 |
1 |
p. 74-76
|
artikel
|
| 15 |
The rôle of phase in diffuse diffraction patterns and its effect on real-space structure
|
Welberry, T. R.
|
|
1991
|
24 |
1 |
p. 18-29
|
artikel
|
| 16 |
Use of a Hewlett-Packard ScanJet image digitizer as an X-ray powder photograph densitometer
|
Calos, N. J.
|
|
1991
|
24 |
1 |
p. 73
|
artikel
|
| 17 |
Visualization software for X-ray diffraction data from area detectors
|
Ohlendorf, D. H.
|
|
1991
|
24 |
1 |
p. 64-66
|
artikel
|
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