| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysis of Co and Cr dopants in epitaxial films of β-FeSi2 by ERDA, RBS, EDX and AES
|
Bohne, W.
|
|
1999
|
|
1-3 |
p. 258-262
|
artikel
|
| 2 |
A photoelectrochemical study of anodic oxides on lead selenide surfaces in alkaline solutions
|
Meincke, H.
|
|
1999
|
|
1-3 |
p. 147-149
|
artikel
|
| 3 |
Application of infrared reflection spectroscopy for the analysis of hard coatings on metallic substrates
|
Heger, P.
|
|
1999
|
|
1-3 |
p. 103-105
|
artikel
|
| 4 |
Application of scanning SIMS techniques for the evaluation of the oxidation behavior of high-purity molybdenum
|
Gritsch, M.
|
|
1999
|
|
1-3 |
p. 188-194
|
artikel
|
| 5 |
Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis
|
Schwenke, H.
|
|
1999
|
|
1-3 |
p. 19-27
|
artikel
|
| 6 |
Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM
|
Reiche, R.
|
|
1999
|
|
1-3 |
p. 76-82
|
artikel
|
| 7 |
Characterisation of biomaterials using ToF-SIMS
|
Léonard, D.
|
|
1999
|
|
1-3 |
p. 3-11
|
artikel
|
| 8 |
Characterisation of boron nitride fibre coatings with different crystalline order by TEM and XPS
|
Dietrich, D.
|
|
1999
|
|
1-3 |
p. 255-257
|
artikel
|
| 9 |
Characterization of polymers in PEFC-electrodes with EDX and XPS
|
Schulze, M.
|
|
1999
|
|
1-3 |
p. 123-132
|
artikel
|
| 10 |
Characterization of transition metal nitride formation in rapid thermal processing (RTP)
|
Galesic, Ivan
|
|
1999
|
|
1-3 |
p. 199-202
|
artikel
|
| 11 |
Chemical interaction and diffusion on interface cathode/electrolyte of SOFC
|
Naoumidis, A.
|
|
1999
|
|
1-3 |
p. 277-281
|
artikel
|
| 12 |
Combined atom probe and STM study of tip-substrate interactions
|
Fian, A.
|
|
1999
|
|
1-3 |
p. 38-42
|
artikel
|
| 13 |
Depth profile and microscopic structure of gold-implanted aluminum using X-ray spectroscopies
|
Baur, K.
|
|
1999
|
|
1-3 |
p. 208-211
|
artikel
|
| 14 |
Effect of surface oxidation on the solution of hydrogen in vanadium
|
Kiss, G.
|
|
1999
|
|
1-3 |
p. 203-207
|
artikel
|
| 15 |
Electron spectroscopy applied to metastable ceramic solution phases
|
Cremer, R.
|
|
1999
|
|
1-3 |
p. 28-37
|
artikel
|
| 16 |
EPMA sputter depth profiling of an InGaAs-InP heterostructure
|
Richter, S.
|
|
1999
|
|
1-3 |
p. 221-226
|
artikel
|
| 17 |
Examinations on the morphology of tarnish layers grown on stainless 18–10 chromium nickel steels
|
Pajonk, G.
|
|
1999
|
|
1-3 |
p. 236-243
|
artikel
|
| 18 |
Factor analysis and XPS-data preprocessing for non-conducting samples
|
Oswald, S.
|
|
1999
|
|
1-3 |
p. 59-62
|
artikel
|
| 19 |
High-resolution analytical transmission electron microscopy of semiconductor quantum structures
|
Schneider, R.
|
|
1999
|
|
1-3 |
p. 217-220
|
artikel
|
| 20 |
Investigation of the properties of a-C:H coatings with graded metal interlayers
|
Nöthe, M.
|
|
1999
|
|
1-3 |
p. 249-254
|
artikel
|
| 21 |
Investigations of local electrical surface characteristics by dynamical scanning force microscopy
|
Hietschold, M.
|
|
1999
|
|
1-3 |
p. 96-98
|
artikel
|
| 22 |
Investigations to calibrate reference standards for the thickness of coatings
|
Ahbe, T.
|
|
1999
|
|
1-3 |
p. 55-58
|
artikel
|
| 23 |
Material removal and chemical and structural changes induced by irradiation of polymer surfaces with KrF-excimer laser radiation
|
Wesner, D. A.
|
|
1999
|
|
1-3 |
p. 183-187
|
artikel
|
| 24 |
Mixed self-assembled monolayers of terminally functionalized thiols at gold surfaces characterized by angle resolved X-ray photoelectron spectroscopy (ARXPS) studies
|
Heeg, J.
|
|
1999
|
|
1-3 |
p. 272-276
|
artikel
|
| 25 |
Morphology and structure of nanoscale Co-Cu multilayers
|
Thomas, J.
|
|
1999
|
|
1-3 |
p. 263-268
|
artikel
|
| 26 |
Nitrogen incorporation into WTi films
|
Burschik, J.
|
|
1999
|
|
1-3 |
p. 269-271
|
artikel
|
| 27 |
Operation and application of a laser mass analyser (LASMA) for multielement analysis
|
Woll, D. M.
|
|
1999
|
|
1-3 |
p. 70-75
|
artikel
|
| 28 |
Peak shape analysis of core level photoelectron spectra using UNIFIT for WINDOWS
|
Hesse, R.
|
|
1999
|
|
1-3 |
p. 48-54
|
artikel
|
| 29 |
Potassium and oxygen diffusion and segregation in nickel
|
Schulze, M.
|
|
1999
|
|
1-3 |
p. 178-182
|
artikel
|
| 30 |
Quantitative analysis of silicon- and aluminium-oxynitride films with EPMA, SIMS, hf-SNMS, hf-GD-OES and FT-IR
|
Dreer, S.
|
|
1999
|
|
1-3 |
p. 85-95
|
artikel
|
| 31 |
Quantitative comparison of ATR-IR spectra of LB and bulk layers of 22-tricosenic acid on inorganic supports
|
Müller, G.
|
|
1999
|
|
1-3 |
p. 43-47
|
artikel
|
| 32 |
Raman spectroscopy of C-, BN-, SiC-layers deposited on multifilament substrates
|
Meyer, N.
|
|
1999
|
|
1-3 |
p. 133-135
|
artikel
|
| 33 |
Recent instrumental developments in magnetic sector SIMS
|
Schuhmacher, M.
|
|
1999
|
|
1-3 |
p. 12-18
|
artikel
|
| 34 |
Robust automated three-dimensional segmentation of secondary ion mass spectrometry image sets
|
Wolkenstein, M.
|
|
1999
|
|
1-3 |
p. 63-69
|
artikel
|
| 35 |
Scanning electrochemical microscopy of enzymes immobilized on structured glass-gold substrates
|
Wilhelm, T.
|
|
1999
|
|
1-3 |
p. 163-167
|
artikel
|
| 36 |
SEM and AES depth profile studies of thin titanium and titanium oxide films covered by nanoscale evaporated Au layers
|
van den Berg, A. H. J.
|
|
1999
|
|
1-3 |
p. 231-235
|
artikel
|
| 37 |
SIMS Analysis of the wear of boron nitride tools for the machining of compacted graphite iron and grey cast iron
|
Gastel, M.
|
|
1999
|
|
1-3 |
p. 142-146
|
artikel
|
| 38 |
SIMS depth profiling, line scanning and imaging analyses of the oxide layer on in-reactor corroded cladding specimens with high lateral resolution
|
Gebhardt, O.
|
|
1999
|
|
1-3 |
p. 117-122
|
artikel
|
| 39 |
Stepped current electromigration test of multilevel aluminum metallizations on wafer level
|
Strasser, M.
|
|
1999
|
|
1-3 |
p. 99-102
|
artikel
|
| 40 |
Structural and optical properties of thin silver films deposited on Si(111)
|
Masten, A.
|
|
1999
|
|
1-3 |
p. 227-230
|
artikel
|
| 41 |
Studies of polycrystalline materials by Pseudo Kossel technique
|
Langer, E.
|
|
1999
|
|
1-3 |
p. 212-216
|
artikel
|
| 42 |
Study of the surface composition of vanadyl pyrophosphate catalysts by XPS and ISS – Influence of Cs+ and water vapor on the surface P/V ratio of (VO)2P2O7 catalysts
|
Richter, F.
|
|
1999
|
|
1-3 |
p. 150-153
|
artikel
|
| 43 |
Surface analytical investigation of the electrochemical and corrosion behaviour of nanocrystalline FeAl8
|
John, A.
|
|
1999
|
|
1-3 |
p. 136-141
|
artikel
|
| 44 |
Surface and interface analysis of PVD Al-O-N and γ-Al2O3 diffusion barriers
|
Cremer, R.
|
|
1999
|
|
1-3 |
p. 158-162
|
artikel
|
| 45 |
Surface characterisation of laser irradiated SiC ceramics by AES and XPS
|
Baunack, S.
|
|
1999
|
|
1-3 |
p. 173-177
|
artikel
|
| 46 |
The dependence of fractal dimension on measuring conditions of scanning probe microscopy
|
Zahn, W.
|
|
1999
|
|
1-3 |
p. 168-172
|
artikel
|
| 47 |
The influence of an epitaxial CoSi2 layer on diffusion of B and Sb in underlying Si during oxidation
|
Tyagi, A. K.
|
|
1999
|
|
1-3 |
p. 282-285
|
artikel
|
| 48 |
The influence of ion beam sputtering on the composition of the near-surface region of silicon carbide layers
|
Ecke, G.
|
|
1999
|
|
1-3 |
p. 195-198
|
artikel
|
| 49 |
10th Working Conference on Applied Surface Analysis (AOFA 10)Kaiserslautern, 6–10 September 1998
|
Oechsner, H.
|
|
1999
|
|
1-3 |
p. 1-2
|
artikel
|
| 50 |
Ultra thin film sputter depth profiling
|
Moulder, J. F.
|
|
1999
|
|
1-3 |
p. 83-84
|
artikel
|
| 51 |
Water uptake of quartz investigated by means of ion-beam analysis
|
Dersch, O.
|
|
1999
|
|
1-3 |
p. 114-116
|
artikel
|
| 52 |
XANES and XPS characterization of hard amorphous CSixNy thin films grown by RF nitrogen plasma assisted pulsed laser deposition
|
Thärigen, T.
|
|
1999
|
|
1-3 |
p. 244-248
|
artikel
|
| 53 |
XPS analysis of electrochemically oxidized nickel surfaces
|
Lorenz, M.
|
|
1999
|
|
1-3 |
p. 154-157
|
artikel
|
| 54 |
XPS analysis of the degradation of Nafion
|
Schulze, M.
|
|
1999
|
|
1-3 |
p. 106-113
|
artikel
|
Tijdschrift beschrijving