| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
About the Secondary Electron Emission Yield, δ, from e−-Irradiated Insulators
|
Cazaux, Jacques
|
|
2000
|
|
2-4 |
p. 173-177
|
artikel
|
| 2 |
About the Secondary Electron Emission Yield, δ, from e−-Irradiated Insulators
|
Cazaux, Jacques
|
|
|
|
2-4 |
p. 173-177
|
artikel
|
| 3 |
AEM of the Solute Redistribution During Discontinuous Dissolution
|
Zięba, Paweł
|
|
2000
|
|
2-4 |
p. 295-299
|
artikel
|
| 4 |
AEM of the Solute Redistribution During Discontinuous Dissolution
|
Zięba, Paweł
|
|
|
|
2-4 |
p. 295-299
|
artikel
|
| 5 |
AFM Investigation on Vickers Indents: An Artefact?
|
Nagy, Péter
|
|
2000
|
|
2-4 |
p. 457-460
|
artikel
|
| 6 |
AFM Investigation on Vickers Indents: An Artefact?
|
Nagy, Péter
|
|
|
|
2-4 |
p. 457-460
|
artikel
|
| 7 |
Analysis of Alloy Nanoparticles
|
Lyman, C. E.
|
|
2000
|
|
2-4 |
p. 301-308
|
artikel
|
| 8 |
Analysis of Alloy Nanoparticles
|
Lyman, C. E.
|
|
|
|
2-4 |
p. 301-308
|
artikel
|
| 9 |
Analysis of Slightly Rough Thin Films by Optical Methods and AFM
|
Franta, Daniel
|
|
2000
|
|
2-4 |
p. 443-447
|
artikel
|
| 10 |
Analysis of Slightly Rough Thin Films by Optical Methods and AFM
|
Franta, Daniel
|
|
|
|
2-4 |
p. 443-447
|
artikel
|
| 11 |
Analytical Electron Microscopy Study of a ZnO-NiO Solid Solution
|
Dražič, Goran
|
|
2000
|
|
2-4 |
p. 289-294
|
artikel
|
| 12 |
Analytical Electron Microscopy Study of a ZnO-NiO Solid Solution
|
Dražič, Goran
|
|
|
|
2-4 |
p. 289-294
|
artikel
|
| 13 |
An Expert System for EPMA
|
Fournier, Cécile
|
|
2000
|
|
2-4 |
p. 531-539
|
artikel
|
| 14 |
An Expert System for EPMA
|
Fournier, Cécile
|
|
|
|
2-4 |
p. 531-539
|
artikel
|
| 15 |
A Novel Micro-Structured Reference Material for Ion and X-Ray Microbeam Analysis
|
WätjenRID="*"ID="*" To whom correspondence should be addressed, Uwe
|
|
2000
|
|
2-4 |
p. 521-525
|
artikel
|
| 16 |
A Novel Micro-Structured Reference Material for Ion and X-Ray Microbeam Analysis
|
Wätjen, Uwe
|
|
|
|
2-4 |
p. 521-525
|
artikel
|
| 17 |
A Novel Monte-Carlo Based Method for Quantitative Thin Film X-Ray Microanalysis
|
ArmigliatoRID="*"ID="*" To whom correspondence should be addressed, Aldo
|
|
2000
|
|
2-4 |
p. 213-218
|
artikel
|
| 18 |
A Novel Monte-Carlo Based Method for Quantitative Thin Film X-Ray Microanalysis
|
Armigliato, Aldo
|
|
|
|
2-4 |
p. 213-218
|
artikel
|
| 19 |
Application of Microbeam Techniques in the Steel Industry
|
Dillen, Henri
|
|
2000
|
|
2-4 |
p. 323-335
|
artikel
|
| 20 |
Application of Microbeam Techniques in the Steel Industry
|
Dillen, Henri
|
|
|
|
2-4 |
p. 323-335
|
artikel
|
| 21 |
Application of Microbeam Techniques to Materials Problemsin a Service Laboratory
|
Kopnarski, Michael
|
|
2000
|
|
2-4 |
p. 401-410
|
artikel
|
| 22 |
Application of Microbeam Techniques to Materials Problemsin a Service Laboratory
|
Kopnarski, Michael
|
|
|
|
2-4 |
p. 401-410
|
artikel
|
| 23 |
Application of Sputter-Assisted EPMA to Depth Profile Analysis
|
Lesch, Norbert
|
|
2000
|
|
2-4 |
p. 377-382
|
artikel
|
| 24 |
Application of Sputter-Assisted EPMA to Depth Profile Analysis
|
Lesch, Norbert
|
|
|
|
2-4 |
p. 377-382
|
artikel
|
| 25 |
Characterisation of Radioactive Particles by SIMS
|
Tamborini, Gabriele
|
|
2000
|
|
2-4 |
p. 411-417
|
artikel
|
| 26 |
Characterisation of Radioactive Particles by SIMS
|
Tamborini, Gabriele
|
|
|
|
2-4 |
p. 411-417
|
artikel
|
| 27 |
Characterization of Defects in Glasses and Coatings on Glasses by Microanalytical Techniques
|
Bange, Klaus
|
|
2000
|
|
2-4 |
p. 493-503
|
artikel
|
| 28 |
Characterization of Defects in Glasses and Coatings on Glasses by Microanalytical Techniques
|
Bange, Klaus
|
|
|
|
2-4 |
p. 493-503
|
artikel
|
| 29 |
Comparative Analysis of a Solar Control Coating on Glass by AES, EPMA, SNMS and SIMS
|
Pidun, Markus
|
|
2000
|
|
2-4 |
p. 429-434
|
artikel
|
| 30 |
Comparative Analysis of a Solar Control Coating on Glass by AES, EPMA, SNMS and SIMS
|
Pidun, Markus
|
|
|
|
2-4 |
p. 429-434
|
artikel
|
| 31 |
Contact Potential Difference of Au and GaInAs by Electrostatic Force Microscopy
|
Bresse, Jean-François
|
|
2000
|
|
2-4 |
p. 449-455
|
artikel
|
| 32 |
Contact Potential Difference of Au and GaInAs by Electrostatic Force Microscopy
|
Bresse, Jean-François
|
|
|
|
2-4 |
p. 449-455
|
artikel
|
| 33 |
Detection Limits of Grazing-Exit EPMA for Particle Analysis
|
Tsuji, Kouichi
|
|
2000
|
|
2-4 |
p. 357-360
|
artikel
|
| 34 |
Detection Limits of Grazing-Exit EPMA for Particle Analysis
|
Tsuji, Kouichi
|
|
|
|
2-4 |
p. 357-360
|
artikel
|
| 35 |
Distribution of Ion-Implanted Nitrogen in Iron Alloys Investigated by AES
|
Baunack, Stefan
|
|
2000
|
|
2-4 |
p. 237-242
|
artikel
|
| 36 |
Distribution of Ion-Implanted Nitrogen in Iron Alloys Investigated by AES
|
Baunack, Stefan
|
|
|
|
2-4 |
p. 237-242
|
artikel
|
| 37 |
Dynamic SIMS: Quantification at All Depths?
|
Zalm, Peer C.
|
|
2000
|
|
2-4 |
p. 243-257
|
artikel
|
| 38 |
Dynamic SIMS: Quantification at All Depths?
|
Zalm, Peer C.
|
|
|
|
2-4 |
p. 243-257
|
artikel
|
| 39 |
EDXTOOLS — Computer Programmes for the Determination of Critical EDX Spectrometer Parameters
|
Procop, Mathias
|
|
2000
|
|
2-4 |
p. 527-530
|
artikel
|
| 40 |
EDXTOOLS — Computer Programmes for the Determination of Critical EDX Spectrometer Parameters
|
Procop, Mathias
|
|
|
|
2-4 |
p. 527-530
|
artikel
|
| 41 |
Effective L-Series Mass Absorption Coefficients for EDS
|
Rickerby, David G.
|
|
2000
|
|
2-4 |
p. 157-161
|
artikel
|
| 42 |
Effective L-Series Mass Absorption Coefficients for EDS
|
Rickerby, David G.
|
|
|
|
2-4 |
p. 157-161
|
artikel
|
| 43 |
Electron Backscattering from Real and In-Situ Treated Surfaces
|
Frank, Luděk
|
|
2000
|
|
2-4 |
p. 179-188
|
artikel
|
| 44 |
Electron Backscattering from Real and In-Situ Treated Surfaces
|
Frank, Luděk
|
|
|
|
2-4 |
p. 179-188
|
artikel
|
| 45 |
Electron Probe Microanalysis of Nitrogen in Glasses and Glass Ceramics
|
Völksch, Günter
|
|
2000
|
|
2-4 |
p. 511-515
|
artikel
|
| 46 |
Electron Probe Microanalysis of Nitrogen in Glasses and Glass Ceramics
|
Völksch, Günter
|
|
|
|
2-4 |
p. 511-515
|
artikel
|
| 47 |
EPMA and Microstructural Characterization of Yttrium Doped BaTiO3 Ceramics
|
SamardžijaRID="*"ID="*" To whom correspondence should be addressed, Zoran
|
|
2000
|
|
2-4 |
p. 383-386
|
artikel
|
| 48 |
EPMA and Microstructural Characterization of Yttrium Doped BaTiO3 Ceramics
|
Samardžija, Zoran
|
|
|
|
2-4 |
p. 383-386
|
artikel
|
| 49 |
EPMA and Quantitative MCs+-SIMS of Metal-DLC Coating Materials
|
Willich, Peter
|
|
2000
|
|
2-4 |
p. 419-427
|
artikel
|
| 50 |
EPMA and Quantitative MCs+-SIMS of Metal-DLC Coating Materials
|
Willich, Peter
|
|
|
|
2-4 |
p. 419-427
|
artikel
|
| 51 |
EPMA of Melted UO2 Fuel Rods Irradiated to a Burn-up of 23 GWd/tU
|
BottomleyRID="*"ID="*" To whom correspondence should be addressed, Paul D.W.
|
|
2000
|
|
2-4 |
p. 391-400
|
artikel
|
| 52 |
EPMA of Melted UO2 Fuel Rods Irradiated to a Burn-up of 23 GWd/tU
|
Bottomley, Paul D.W.
|
|
|
|
2-4 |
p. 391-400
|
artikel
|
| 53 |
EPMA of Porous Media: A Monte Carlo Approach
|
Sorbier, Loïc
|
|
2000
|
|
2-4 |
p. 189-199
|
artikel
|
| 54 |
EPMA of Porous Media: A Monte Carlo Approach
|
Sorbier, Loïc
|
|
|
|
2-4 |
p. 189-199
|
artikel
|
| 55 |
High Resolution Surface Analysis by TOF-SIMS
|
Hagenhoff, Birgit
|
|
2000
|
|
2-4 |
p. 259-271
|
artikel
|
| 56 |
High Resolution Surface Analysis by TOF-SIMS
|
Hagenhoff, Birgit
|
|
|
|
2-4 |
p. 259-271
|
artikel
|
| 57 |
High-Spatial-Resolution Low-Energy Electron Beam X-Ray Microanalysis
|
Barkshire, Ian
|
|
2000
|
|
2-4 |
p. 113-128
|
artikel
|
| 58 |
High-Spatial-Resolution Low-Energy Electron Beam X-Ray Microanalysis
|
Barkshire, Ian
|
|
|
|
2-4 |
p. 113-128
|
artikel
|
| 59 |
Investigation of Inhomogeneites in Epitaxial AlxGa1−xN Layers Grown on Sapphire
|
TretyakovRID="*"ID="*" To whom correspondence should be addressed, Vladimir V.
|
|
2000
|
|
2-4 |
p. 361-364
|
artikel
|
| 60 |
Investigation of Inhomogeneites in Epitaxial AlxGa1−xN Layers Grown on Sapphire
|
Tretyakov, Vladimir V.
|
|
|
|
2-4 |
p. 361-364
|
artikel
|
| 61 |
Light Element Analysis of Individual Microparticles Using Thin-Window EPMA
|
Osán, János
|
|
2000
|
|
2-4 |
p. 349-355
|
artikel
|
| 62 |
Light Element Analysis of Individual Microparticles Using Thin-Window EPMA
|
Osán, János
|
|
|
|
2-4 |
p. 349-355
|
artikel
|
| 63 |
Low Voltage EDXS and Elements of the First Transition Series
|
Poelt, Peter
|
|
2000
|
|
2-4 |
p. 129-135
|
artikel
|
| 64 |
Low Voltage EDXS and Elements of the First Transition Series
|
Poelt, Peter
|
|
|
|
2-4 |
p. 129-135
|
artikel
|
| 65 |
Mathematical Modelling of 3D Electron-Photon Transport in Microbeam Analysis
|
Fernández, Jorge E.
|
|
2000
|
|
2-4 |
p. 219-224
|
artikel
|
| 66 |
Mathematical Modelling of 3D Electron-Photon Transport in Microbeam Analysis
|
Fernández, Jorge E.
|
|
|
|
2-4 |
p. 219-224
|
artikel
|
| 67 |
Microanalysis of Glass Containing Alkali Ions
|
Gedeon, Ondrej
|
|
2000
|
|
2-4 |
p. 505-510
|
artikel
|
| 68 |
Microanalysis of Glass Containing Alkali Ions
|
Gedeon, Ondrej
|
|
|
|
2-4 |
p. 505-510
|
artikel
|
| 69 |
Modern Developments and Applications in Microbeam Analysis Proceedings of the 6th Workshop of the European Microbeam Analysis Society (EMAS), May 3-7, 1999, Konstanz, Germany
|
Walker, C. T.
|
|
2000
|
|
2-4 |
p. V-VII
|
artikel
|
| 70 |
Modern Developments and Applications in Microbeam Analysis Proceedings of the 6th Workshop of the European Microbeam Analysis Society (EMAS), May 3-7, 1999, Konstanz, Germany
|
Walker, C. T.
|
|
|
|
2-4 |
p. V-VII
|
artikel
|
| 71 |
Monte Carlo Simulation of Secondary Fluorescence in Small Particles and at Phase Boundaries
|
Llovet, Xavier
|
|
2000
|
|
2-4 |
p. 205-212
|
artikel
|
| 72 |
Monte Carlo Simulation of Secondary Fluorescence in Small Particles and at Phase Boundaries
|
Llovet, Xavier
|
|
|
|
2-4 |
p. 205-212
|
artikel
|
| 73 |
Multiple Electron Beam Analyses Applied to Eclogite from the Western Alps
|
Borghi, Alessandro
|
|
2000
|
|
2-4 |
p. 479-487
|
artikel
|
| 74 |
Multiple Electron Beam Analyses Applied to Eclogite from the Western Alps
|
Borghi, Alessandro
|
|
|
|
2-4 |
p. 479-487
|
artikel
|
| 75 |
Orientation Imaging Microscopy Applied to Zirconia Ceramics
|
Faryna, Marek
|
|
2000
|
|
2-4 |
p. 517-520
|
artikel
|
| 76 |
Orientation Imaging Microscopy Applied to Zirconia Ceramics
|
Faryna, Marek
|
|
|
|
2-4 |
p. 517-520
|
artikel
|
| 77 |
Quantitative AES-Mapping and Depth Profiling
|
Prutton, Martin
|
|
2000
|
|
2-4 |
p. 225-236
|
artikel
|
| 78 |
Quantitative AES-Mapping and Depth Profiling
|
Prutton, Martin
|
|
|
|
2-4 |
p. 225-236
|
artikel
|
| 79 |
Quantitative Analysis of Ti-Si-Ge/Si-Ge/Si Structures by EDS and AES
|
Berner, Alexander I.
|
|
2000
|
|
2-4 |
p. 461-465
|
artikel
|
| 80 |
Quantitative Analysis of Ti-Si-Ge/Si-Ge/Si Structures by EDS and AES
|
Berner, Alexander I.
|
|
|
|
2-4 |
p. 461-465
|
artikel
|
| 81 |
Quantitative Energy-Filtering Transmission Electron Microscopy (EFTEM)
|
Hofer, Ferdinand
|
|
2000
|
|
2-4 |
p. 273-288
|
artikel
|
| 82 |
Quantitative Energy-Filtering Transmission Electron Microscopy (EFTEM)
|
Hofer, Ferdinand
|
|
|
|
2-4 |
p. 273-288
|
artikel
|
| 83 |
Quantitative Trace Analysis by Wavelength-Dispersive EPMA
|
Reed, Stephen J. B.
|
|
2000
|
|
2-4 |
p. 145-151
|
artikel
|
| 84 |
Quantitative Trace Analysis by Wavelength-Dispersive EPMA
|
Reed, Stephen J. B.
|
|
|
|
2-4 |
p. 145-151
|
artikel
|
| 85 |
Relative Cross Sections for L- and M-Shell Ionization by Electron Impact
|
Llovet, Xavier
|
|
2000
|
|
2-4 |
p. 163-171
|
artikel
|
| 86 |
Relative Cross Sections for L- and M-Shell Ionization by Electron Impact
|
Llovet, Xavier
|
|
|
|
2-4 |
p. 163-171
|
artikel
|
| 87 |
Scanning Probe Microscopy and Spectroscopy of CVD Diamond Films
|
Fan, Yongchang
|
|
2000
|
|
2-4 |
p. 435-441
|
artikel
|
| 88 |
Scanning Probe Microscopy and Spectroscopy of CVD Diamond Films
|
Fan, Yongchang
|
|
|
|
2-4 |
p. 435-441
|
artikel
|
| 89 |
SEM-EDS and XPS Studies of the High Temperature Oxidation Behaviour of Inconel 718
|
DelaunayRID="*"ID="*" To whom correspondence should be addressed, François
|
|
2000
|
|
2-4 |
p. 337-343
|
artikel
|
| 90 |
SEM-EDS and XPS Studies of the High Temperature Oxidation Behaviour of Inconel 718
|
Delaunay, François
|
|
|
|
2-4 |
p. 337-343
|
artikel
|
| 91 |
SEM-EDS Investigation of Scale Formation on Low Carbon, Low Alloy Steel
|
Szabó, Péter J.
|
|
2000
|
|
2-4 |
p. 345-348
|
artikel
|
| 92 |
SEM-EDS Investigation of Scale Formation on Low Carbon, Low Alloy Steel
|
Szabó, Péter J.
|
|
|
|
2-4 |
p. 345-348
|
artikel
|
| 93 |
Simulation of X-Ray Emission from Rough Surfaces
|
Gauvin, Raynald
|
|
2000
|
|
2-4 |
p. 201-204
|
artikel
|
| 94 |
Simulation of X-Ray Emission from Rough Surfaces
|
Gauvin, Raynald
|
|
|
|
2-4 |
p. 201-204
|
artikel
|
| 95 |
Sites are Separable in Garnets with ALCHEMI
|
Lábár, János L.
|
|
2000
|
|
2-4 |
p. 489-492
|
artikel
|
| 96 |
Sites are Separable in Garnets with ALCHEMI
|
Lábár, János L.
|
|
|
|
2-4 |
p. 489-492
|
artikel
|
| 97 |
Spectral Interferences in Light Element Analysis
|
Buckley, Andy
|
|
2000
|
|
2-4 |
p. 153-155
|
artikel
|
| 98 |
Spectral Interferences in Light Element Analysis
|
Buckley, Andy
|
|
|
|
2-4 |
p. 153-155
|
artikel
|
| 99 |
Structural Analysis of Electroplated Amorphous-Nanocrystalline Ni-W
|
Schloßmacher, Peter
|
|
2000
|
|
2-4 |
p. 309-313
|
artikel
|
| 100 |
Structural Analysis of Electroplated Amorphous-Nanocrystalline Ni-W
|
Schloßmacher, Peter
|
|
|
|
2-4 |
p. 309-313
|
artikel
|
| 101 |
Study of the Interface Microstructures of CVD Diamond Films by TEM
|
Fitzgerald, Alexander G.
|
|
2000
|
|
2-4 |
p. 315-321
|
artikel
|
| 102 |
Study of the Interface Microstructures of CVD Diamond Films by TEM
|
Fitzgerald, Alexander G.
|
|
|
|
2-4 |
p. 315-321
|
artikel
|
| 103 |
Study of Thin Films of High Temperature Superconductors Based on YBaCuO by EPMA
|
TretyakovRID="*"ID="*" To whom correspondence should be addressed, Vladimir V.
|
|
2000
|
|
2-4 |
p. 365-375
|
artikel
|
| 104 |
Study of Thin Films of High Temperature Superconductors Based on YBaCuO by EPMA
|
Tretyakov, Vladimir V.
|
|
|
|
2-4 |
p. 365-375
|
artikel
|
| 105 |
The Observation of Strong Absorption of the Yttrium Lα Line in Sialon Ceramics
|
Żelechower, Michał
|
|
2000
|
|
2-4 |
p. 387-390
|
artikel
|
| 106 |
The Observation of Strong Absorption of the Yttrium Lα Line in Sialon Ceramics
|
Żelechower, Michał
|
|
|
|
2-4 |
p. 387-390
|
artikel
|
| 107 |
Understanding the History of Rocks by the Use of Microbeam Analysis Techniques
|
Ottolini, Luisa P.
|
|
2000
|
|
2-4 |
p. 467-478
|
artikel
|
| 108 |
Understanding the History of Rocks by the Use of Microbeam Analysis Techniques
|
Ottolini, Luisa P.
|
|
|
|
2-4 |
p. 467-478
|
artikel
|
| 109 |
X-Ray Microanalysis in the Environmental SEM: A Challenge or a Contradiction?
|
Mansfield, John F.
|
|
2000
|
|
2-4 |
p. 137-143
|
artikel
|
| 110 |
X-Ray Microanalysis in the Environmental SEM: A Challenge or a Contradiction?
|
Mansfield, John F.
|
|
|
|
2-4 |
p. 137-143
|
artikel
|
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