IBL Tool - Digital Library

Digital Library

Journal description

All volumes of the corresponding journal

All issues of the corresponding volume

All articles of the corresponding issues

8 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	Current-feedback operational amplifier: Some features of its transient radiation response	Agakhanyan, T. M.		2008	37	1	p. 55-61	article
2	Estimating IC susceptibility to single-event latchup	Chumakov, A. I.		2008	37	1	p. 41-46	article
3	Evaluating the effect of photogeneration nonuniformity on the accuracy of laser simulation of the transient radiation response in semiconductor devices and circuits	Nikiforov, A. Y.		2008	37	1	p. 2-14	article
4	Evaluating the effect of temperature on the accuracy of laser simulation of the transient radiation response in semiconductor devices and circuits	Nikiforov, A. Y.		2008	37	1	p. 15-24	article
5	Foreword to the special issue on ionizing-radiation effects in microelectronics			2008	37	1	p. 1	article
6	Method for online nondestructive hardness assurance for CMOS LSI circuits realized in SOS technology	Davydov, G. G.		2008	37	1	p. 62-71	article
7	Simulating single-event effects associated with high-energy neutrons for different VLSI technologies	Baranov, S. V.		2008	37	1	p. 47-54	article
8	Simulating the response of SOS CMOS building blocks to pulsed ionizing irradiation	Kirgizova, A. V.		2008	37	1	p. 25-40	article

8 results found

Koninklijke Bibliotheek - National Library of the Netherlands