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                             18 results found
no title author magazine year volume issue page(s) type
1 A Microstrip Thin-Film Low-Field Magnetic Transducer Belyaev, B. A.
2001
30 3 p. 195-202
article
2 A Microstrip Thin-Film Low-Field Magnetic Transducer B. A. Belyaev
2001
30 3 p. 195-202
8 p.
article
3 A Microwave High-Density Plasma Source for Submicron Silicon IC Technology Averkin, S. N.
2001
30 3 p. 155-159
article
4 A Microwave High-Density Plasma Source for Submicron Silicon IC Technology S. N. Averkin
2001
30 3 p. 155-159
5 p.
article
5 Electron Microscopy Study of Ferroelectric Memory Based on Si–SiO2–Ti–Pt–PZT Multilayer Structure Zhigalina, O. M.
2001
30 3 p. 175-186
article
6 Electron Microscopy Study of Ferroelectric Memory Based on SiSiO2TiPtPZT Multilayer Structure O. M. Zhigalina
2001
30 3 p. 175-178
4 p.
article
7 In situ Diagnostics of Plasma Processes in Microelectronics: The Current Status and Prospects. Part II Orlikovskii, A. A.
2001
30 3 p. 137-154
article
8 In situDiagnostics of Plasma Processes in Microelectronics: The Current Status and Prospects. Part II A. A. Orlikovskii
2001
30 3 p. 137-154
18 p.
article
9 Investigation of the Metal Deposited into Nanopores of Anodic Alumina upon Fabricating Substrates for Microelectronic Devices Mukhurov, N. I.
2001
30 3 p. 187-190
article
10 Investigation of the Metal Deposited into Nanopores of Anodic Alumina upon Fabricating Substrates for Microelectronic Devices N. I. Mukhurov
2001
30 3 p. 187-190
4 p.
article
11 Microwave Plasmatrons for Fabrication of High-Density Integrated Circuits Petrin, A. B.
2001
30 3 p. 160-172
article
12 Microwave Plasmatrons for Fabrication of High-Density Integrated Circuits A. B. Petrin
2001
30 3 p. 160-172
13 p.
article
13 Silicon Surface Cleaning by Wet Etching for IC Production in a Closed Manufacturing System Snitovskii, Yu. P.
2001
30 3 p. 191-194
article
14 Silicon Surface Cleaning by Wet Etching for IC Production in a Closed Manufacturing System Yu. P. Snitovskii
2001
30 3 p. 191-194
4 p.
article
15 Specific Features of the Current–Voltage Characteristics of p–nStructures with an Interfacial Layer in the Base Region Sokolovskii, B. S.
2001
30 3 p. 203-205
article
16 Specific Features of the CurrentVoltage Characteristics of pnStructures with an Interfacial Layer in the Base Region B. S. Sokolovskii
2001
30 3 p. 203-205
3 p.
article
17 Superlarge Defects in CZ Si : B Single Crystals Yur'ev, V. A.
2001
30 3 p. 173-174
article
18 Superlarge Defects in CZ Si : B Single Crystals V. A. Yur'ev
2001
30 3 p. 173-174
2 p.
article
                             18 results found
 
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