| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Adaptive Debug and Diagnosis Without Fault Dictionaries
|
Holst, Stefan
|
|
2009
|
|
4-5 |
p. 259-268
|
artikel
|
| 2 |
A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz Range
|
Fernández, R.
|
|
2009
|
|
4-5 |
p. 279-283
|
artikel
|
| 3 |
An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch
|
Basu, Subhayu
|
|
2002
|
|
4-5 |
p. 475-485
|
artikel
|
| 4 |
An Integrated Framework for the Design and Optimization of SOC Test Solutions
|
Larsson, Erik
|
|
2002
|
|
4-5 |
p. 385-400
|
artikel
|
| 5 |
A Novel Reconfigurable Wrapper for Testing of Embedded Core-Based SOCs and its Associated Scheduling Algorithm
|
Koranne, Sandeep
|
|
2002
|
|
4-5 |
p. 415-434
|
artikel
|
| 6 |
A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard
|
Natale, G. Di
|
|
2009
|
|
4-5 |
p. 269-278
|
artikel
|
| 7 |
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing
|
Benabdenbi, Mounir
|
|
2002
|
|
4-5 |
p. 455-473
|
artikel
|
| 8 |
Critical Path Selection for Delay Testing Considering Coupling Noise
|
Tayade, Rajeshwary
|
|
2009
|
|
4-5 |
p. 213-223
|
artikel
|
| 9 |
Design for Consecutive Testability of System-on-a-Chip with Built-In Self Testable Cores
|
Yoneda, Tomokazu
|
|
2002
|
|
4-5 |
p. 487-501
|
artikel
|
| 10 |
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
|
Jas, Abhijit
|
|
2002
|
|
4-5 |
p. 503-514
|
artikel
|
| 11 |
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test
|
Li, Jin-Fu
|
|
2002
|
|
4-5 |
p. 515-527
|
artikel
|
| 12 |
Editorial
|
Agrawal, Vishwani D.
|
|
2002
|
|
4-5 |
p. 359
|
artikel
|
| 13 |
Editorial
|
Agrawal, Vishwani D.
|
|
2009
|
|
4-5 |
p. 209
|
artikel
|
| 14 |
Fault Detection Structures of the S-boxes and the Inverse S-boxes for the Advanced Encryption Standard
|
Mozaffari-Kermani, Mehran
|
|
2009
|
|
4-5 |
p. 225-245
|
artikel
|
| 15 |
Guest Editorial
|
Chakrabarty, Krishnendu
|
|
2002
|
|
4-5 |
p. 363
|
artikel
|
| 16 |
On-Chip Clock Faults' Detector
|
Metra, C.
|
|
2002
|
|
4-5 |
p. 555-564
|
artikel
|
| 17 |
On Concurrent Test of Core-Based SOC Design
|
Huang, Yu
|
|
2002
|
|
4-5 |
p. 401-414
|
artikel
|
| 18 |
On IEEE P1500's Standard for Embedded Core Test
|
Marinissen, Erik Jan
|
|
2002
|
|
4-5 |
p. 365-383
|
artikel
|
| 19 |
Signal Integrity: Fault Modeling and Testing in High-Speed SoCs
|
Nourani, Mehrdad
|
|
2002
|
|
4-5 |
p. 539-554
|
artikel
|
| 20 |
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
|
Chen, Li
|
|
2002
|
|
4-5 |
p. 529-538
|
artikel
|
| 21 |
Test Technology Newsletter
|
|
|
2009
|
|
4-5 |
p. 211-212
|
artikel
|
| 22 |
Test Technology Technical Council Newsletter
|
Ivanov, A.
|
|
2002
|
|
4-5 |
p. 361-362
|
artikel
|
| 23 |
The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs
|
Marinissen, Erik Jan
|
|
2002
|
|
4-5 |
p. 435-454
|
artikel
|
| 24 |
X-tolerant Test Data Compaction with Accelerated Shift Registers
|
Hilscher, Martin
|
|
2009
|
|
4-5 |
p. 247-258
|
artikel
|
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