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                             51 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Accurate extraction of maximum current densities from the layout Seidl, Albert

5 4 p. 381-384
artikel
2 A 3D moving grid algorithm for process simulation Strecker, N.

5 4 p. 297-300
artikel
3 A drain current model for Schottky-barrier CNT-FETs Jiménez, David

5 4 p. 361-364
artikel
4 A linear response Monte Carlo algorithm for inversion layers and magnetotransport Jungemann, Christoph

5 4 p. 411-414
artikel
5 An evolution algorithm for noise modeling of HEMT’s down to cryogenic temperatures Caddemi, Alina

5 4 p. 337-340
artikel
6 An improved Wigner Monte-Carlo technique for the self-consistent simulation of RTDs Querlioz, Damien

5 4 p. 443-446
artikel
7 An iterative matrix solution of the Boltzmann equation for the calculation of diffusion and noise in semiconductors Diyadi, J.

5 4 p. 261-266
artikel
8 A novel approach to three-dimensional semiconductor process simulation: Application to thermal oxidation Suvorov, Vasily

5 4 p. 291-295
artikel
9 A novel framework for distributing computations DisPyTE – distributing Python tasks environment Fühner, Tim

5 4 p. 349-352
artikel
10 A simulation-based evolutionary technique for inverse doping profile problem of sub-65 nm CMOS devices Li, Yiming

5 4 p. 365-370
artikel
11 Calibration of the Density-Gradient model by using the multidimensional effective-mass Schrödinger equation Andrei, Petru

5 4 p. 315-318
artikel
12 Design perspective against random dopant fluctuation and process variation for scaling multi-gate devices Ashizawa, Yoshio

5 4 p. 319-322
artikel
13 DSMC versus WENO-BTE: A double gate MOSFET example Cáceres, Maria José

5 4 p. 471-474
artikel
14 Editorial Kosina, Hans

5 4 p. 283
artikel
15 Effects of lithography non-uniformity on device electrical behavior. Simple stochastic modeling of material and process effects on device performance Patsis, George P.

5 4 p. 341-344
artikel
16 Efficient full-flow process simulation for 3D structures including stress modeling Gencer, Alp H.

5 4 p. 353-356
artikel
17 Full-band particle-based simulation of 85 nm AlInSb/InSb quantum well transistors Faralli, Nicolas

5 4 p. 483-486
artikel
18 Global Modeling of high frequency devices Ayubi-Moak, J. S.

5 4 p. 415-418
artikel
19 Hot electron distribution function for the Boltzmann equation with analytic bands Muscato, Orazio

5 4 p. 377-380
artikel
20 Human body model ESD simulation including self heating effect Takani, T.

5 4 p. 393-395
artikel
21 Influences of grain structure on thermally induced stresses in 3D IC inter-wafer vias Bentz, D. N.

5 4 p. 327-331
artikel
22 Intrinsic parameter fluctuations due to random grain orientations in high-κ gate stacks Brown, Andrew R.

5 4 p. 333-336
artikel
23 Introducing energy broadening in semiclassical Monte Carlo simulations Ferrari, Giulio

5 4 p. 419-423
artikel
24 Joule heating and phonon transport in silicon MOSFETs Aksamija, Zlatan

5 4 p. 431-434
artikel
25 Kinetic-energy transport equation for the modeling of ballistic MOSFETs Tang, Ting-Wei

5 4 p. 301-304
artikel
26 Kinetic Monte-Carlo simulations of germanium epitaxial growth on silicon Akis, Richard

5 4 p. 451-454
artikel
27 Meshless solution of the 3-D semiconductor Poisson equation Aksamija, Zlatan

5 4 p. 459-462
artikel
28 Modeling p-channel SiGe MOSFETs by taking into account the band-structure and the size quantization effects self-consistently Krishnan, S.

5 4 p. 435-438
artikel
29 Model plasma dispersion functions for SO phonon scattering in Monte Carlo simulations of high-κ dielectric MOSFETS Barker, J. R.

5 4 p. 463-466
artikel
30 Monte Carlo simulation of double gate MOSFET including multi sub-band description Saint-Martin, J.

5 4 p. 439-442
artikel
31 Negative gate-overlap in nanoscaled DG-MOSFETs with asymmetric gate bias Shao, Xue

5 4 p. 389-392
artikel
32 Numerical analysis of a DAR IMPATT diode Zemliak, Alexander M.

5 4 p. 401-404
artikel
33 Numerical simulation and comparison of electrical characteristics between uniaxial strained bulk and SOI FinFETs Li, Yiming

5 4 p. 371-376
artikel
34 On a simple and accurate quantum correction for Monte Carlo simulation Bufler, F. M.

5 4 p. 467-469
artikel
35 Particle-based simulation: An algorithmic perspective Saraniti, Marco

5 4 p. 405-410
artikel
36 Power·delay product in COSMOS logic circuits Al-Ahmadi, Ahmad

5 4 p. 305-309
artikel
37 Quantum correction for DG MOSFETs Wagner, Martin

5 4 p. 397-400
artikel
38 Scattering and space-charge effects in Wigner Monte Carlo simulations of single and double barrier devices Sverdlov, Viktor

5 4 p. 447-450
artikel
39 Scattering and space-charge effects in Wigner Monte Carlo simulations of single and double barrier devices Sverdlov, Viktor
2007
5 4 p. 487
artikel
40 Schrödinger/Luttinger approach to scaled MOS transport for various crystal orientations and its experimental verifications Okada, Takako

5 4 p. 425-429
artikel
41 Self-consistent ion transport simulation in carbon nanotube channels Eschermann, Jan F.

5 4 p. 455-457
artikel
42 Simulation of piezoresistivity effect in FETs Auf der Maur, Matthias

5 4 p. 323-326
artikel
43 Simulation of slow current transients and current compression in AlGaAs/GaAs HFETs Ikarashi, H.

5 4 p. 357-360
artikel
44 SSOR preconditioned GPBiCG method for the linear interference cancellation of asynchronous CDMA systems Yang, L.

5 4 p. 267-273
artikel
45 Statistical study of the effect of interface charge fluctuations in HEMTs using a 3D simulator Seoane, N.

5 4 p. 385-388
artikel
46 Study of fluctuations in advanced MOSFETs using a 3D finite element parallel simulator Aldegunde, M.

5 4 p. 311-314
artikel
47 Super-resolution using neural networks based on the optimal recovery theory Huang, Yizhen

5 4 p. 275-281
artikel
48 The 3D nanometer device project nextnano: Concepts, methods, results Trellakis, Alex

5 4 p. 285-289
artikel
49 Thermal noise in nanometric DG-MOSFET Dollfus, P.

5 4 p. 479-482
artikel
50 Transient TCAD simulation of three-stage organic ring oscillator Erlen, C.

5 4 p. 345-348
artikel
51 Wave-mixing effects on electronic noise in semiconductors Adorno, D. Persano

5 4 p. 475-477
artikel
                             51 gevonden resultaten
 
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