nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accurate extraction of maximum current densities from the layout
|
Seidl, Albert |
|
|
5 |
4 |
p. 381-384 |
artikel |
2 |
A 3D moving grid algorithm for process simulation
|
Strecker, N. |
|
|
5 |
4 |
p. 297-300 |
artikel |
3 |
A drain current model for Schottky-barrier CNT-FETs
|
Jiménez, David |
|
|
5 |
4 |
p. 361-364 |
artikel |
4 |
A linear response Monte Carlo algorithm for inversion layers and magnetotransport
|
Jungemann, Christoph |
|
|
5 |
4 |
p. 411-414 |
artikel |
5 |
An evolution algorithm for noise modeling of HEMT’s down to cryogenic temperatures
|
Caddemi, Alina |
|
|
5 |
4 |
p. 337-340 |
artikel |
6 |
An improved Wigner Monte-Carlo technique for the self-consistent simulation of RTDs
|
Querlioz, Damien |
|
|
5 |
4 |
p. 443-446 |
artikel |
7 |
An iterative matrix solution of the Boltzmann equation for the calculation of diffusion and noise in semiconductors
|
Diyadi, J. |
|
|
5 |
4 |
p. 261-266 |
artikel |
8 |
A novel approach to three-dimensional semiconductor process simulation: Application to thermal oxidation
|
Suvorov, Vasily |
|
|
5 |
4 |
p. 291-295 |
artikel |
9 |
A novel framework for distributing computations DisPyTE – distributing Python tasks environment
|
Fühner, Tim |
|
|
5 |
4 |
p. 349-352 |
artikel |
10 |
A simulation-based evolutionary technique for inverse doping profile problem of sub-65 nm CMOS devices
|
Li, Yiming |
|
|
5 |
4 |
p. 365-370 |
artikel |
11 |
Calibration of the Density-Gradient model by using the multidimensional effective-mass Schrödinger equation
|
Andrei, Petru |
|
|
5 |
4 |
p. 315-318 |
artikel |
12 |
Design perspective against random dopant fluctuation and process variation for scaling multi-gate devices
|
Ashizawa, Yoshio |
|
|
5 |
4 |
p. 319-322 |
artikel |
13 |
DSMC versus WENO-BTE: A double gate MOSFET example
|
Cáceres, Maria José |
|
|
5 |
4 |
p. 471-474 |
artikel |
14 |
Editorial
|
Kosina, Hans |
|
|
5 |
4 |
p. 283 |
artikel |
15 |
Effects of lithography non-uniformity on device electrical behavior. Simple stochastic modeling of material and process effects on device performance
|
Patsis, George P. |
|
|
5 |
4 |
p. 341-344 |
artikel |
16 |
Efficient full-flow process simulation for 3D structures including stress modeling
|
Gencer, Alp H. |
|
|
5 |
4 |
p. 353-356 |
artikel |
17 |
Full-band particle-based simulation of 85 nm AlInSb/InSb quantum well transistors
|
Faralli, Nicolas |
|
|
5 |
4 |
p. 483-486 |
artikel |
18 |
Global Modeling of high frequency devices
|
Ayubi-Moak, J. S. |
|
|
5 |
4 |
p. 415-418 |
artikel |
19 |
Hot electron distribution function for the Boltzmann equation with analytic bands
|
Muscato, Orazio |
|
|
5 |
4 |
p. 377-380 |
artikel |
20 |
Human body model ESD simulation including self heating effect
|
Takani, T. |
|
|
5 |
4 |
p. 393-395 |
artikel |
21 |
Influences of grain structure on thermally induced stresses in 3D IC inter-wafer vias
|
Bentz, D. N. |
|
|
5 |
4 |
p. 327-331 |
artikel |
22 |
Intrinsic parameter fluctuations due to random grain orientations in high-κ gate stacks
|
Brown, Andrew R. |
|
|
5 |
4 |
p. 333-336 |
artikel |
23 |
Introducing energy broadening in semiclassical Monte Carlo simulations
|
Ferrari, Giulio |
|
|
5 |
4 |
p. 419-423 |
artikel |
24 |
Joule heating and phonon transport in silicon MOSFETs
|
Aksamija, Zlatan |
|
|
5 |
4 |
p. 431-434 |
artikel |
25 |
Kinetic-energy transport equation for the modeling of ballistic MOSFETs
|
Tang, Ting-Wei |
|
|
5 |
4 |
p. 301-304 |
artikel |
26 |
Kinetic Monte-Carlo simulations of germanium epitaxial growth on silicon
|
Akis, Richard |
|
|
5 |
4 |
p. 451-454 |
artikel |
27 |
Meshless solution of the 3-D semiconductor Poisson equation
|
Aksamija, Zlatan |
|
|
5 |
4 |
p. 459-462 |
artikel |
28 |
Modeling p-channel SiGe MOSFETs by taking into account the band-structure and the size quantization effects self-consistently
|
Krishnan, S. |
|
|
5 |
4 |
p. 435-438 |
artikel |
29 |
Model plasma dispersion functions for SO phonon scattering in Monte Carlo simulations of high-κ dielectric MOSFETS
|
Barker, J. R. |
|
|
5 |
4 |
p. 463-466 |
artikel |
30 |
Monte Carlo simulation of double gate MOSFET including multi sub-band description
|
Saint-Martin, J. |
|
|
5 |
4 |
p. 439-442 |
artikel |
31 |
Negative gate-overlap in nanoscaled DG-MOSFETs with asymmetric gate bias
|
Shao, Xue |
|
|
5 |
4 |
p. 389-392 |
artikel |
32 |
Numerical analysis of a DAR IMPATT diode
|
Zemliak, Alexander M. |
|
|
5 |
4 |
p. 401-404 |
artikel |
33 |
Numerical simulation and comparison of electrical characteristics between uniaxial strained bulk and SOI FinFETs
|
Li, Yiming |
|
|
5 |
4 |
p. 371-376 |
artikel |
34 |
On a simple and accurate quantum correction for Monte Carlo simulation
|
Bufler, F. M. |
|
|
5 |
4 |
p. 467-469 |
artikel |
35 |
Particle-based simulation: An algorithmic perspective
|
Saraniti, Marco |
|
|
5 |
4 |
p. 405-410 |
artikel |
36 |
Power·delay product in COSMOS logic circuits
|
Al-Ahmadi, Ahmad |
|
|
5 |
4 |
p. 305-309 |
artikel |
37 |
Quantum correction for DG MOSFETs
|
Wagner, Martin |
|
|
5 |
4 |
p. 397-400 |
artikel |
38 |
Scattering and space-charge effects in Wigner Monte Carlo simulations of single and double barrier devices
|
Sverdlov, Viktor |
|
|
5 |
4 |
p. 447-450 |
artikel |
39 |
Scattering and space-charge effects in Wigner Monte Carlo simulations of single and double barrier devices
|
Sverdlov, Viktor |
|
2007 |
5 |
4 |
p. 487 |
artikel |
40 |
Schrödinger/Luttinger approach to scaled MOS transport for various crystal orientations and its experimental verifications
|
Okada, Takako |
|
|
5 |
4 |
p. 425-429 |
artikel |
41 |
Self-consistent ion transport simulation in carbon nanotube channels
|
Eschermann, Jan F. |
|
|
5 |
4 |
p. 455-457 |
artikel |
42 |
Simulation of piezoresistivity effect in FETs
|
Auf der Maur, Matthias |
|
|
5 |
4 |
p. 323-326 |
artikel |
43 |
Simulation of slow current transients and current compression in AlGaAs/GaAs HFETs
|
Ikarashi, H. |
|
|
5 |
4 |
p. 357-360 |
artikel |
44 |
SSOR preconditioned GPBiCG method for the linear interference cancellation of asynchronous CDMA systems
|
Yang, L. |
|
|
5 |
4 |
p. 267-273 |
artikel |
45 |
Statistical study of the effect of interface charge fluctuations in HEMTs using a 3D simulator
|
Seoane, N. |
|
|
5 |
4 |
p. 385-388 |
artikel |
46 |
Study of fluctuations in advanced MOSFETs using a 3D finite element parallel simulator
|
Aldegunde, M. |
|
|
5 |
4 |
p. 311-314 |
artikel |
47 |
Super-resolution using neural networks based on the optimal recovery theory
|
Huang, Yizhen |
|
|
5 |
4 |
p. 275-281 |
artikel |
48 |
The 3D nanometer device project nextnano: Concepts, methods, results
|
Trellakis, Alex |
|
|
5 |
4 |
p. 285-289 |
artikel |
49 |
Thermal noise in nanometric DG-MOSFET
|
Dollfus, P. |
|
|
5 |
4 |
p. 479-482 |
artikel |
50 |
Transient TCAD simulation of three-stage organic ring oscillator
|
Erlen, C. |
|
|
5 |
4 |
p. 345-348 |
artikel |
51 |
Wave-mixing effects on electronic noise in semiconductors
|
Adorno, D. Persano |
|
|
5 |
4 |
p. 475-477 |
artikel |