no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
A data acquisition system and a trigger of the SCAN setup
|
Afanasiev, S. V. |
|
2008 |
51 |
1 |
p. 28-33 |
article |
2 |
A gas microflowmeter with a specified sensitivity value
|
Rumyantsev, A. V. |
|
2008 |
51 |
1 |
p. 137-141 |
article |
3 |
Application of a low-energy electron beam as a tool of nondestructive diagnostics of intense charged-particle beams
|
Logachev, P. V. |
|
2008 |
51 |
1 |
p. 1-27 |
article |
4 |
A RKK-1-100 X-ray calibration facility
|
Gilev, O. N. |
|
2008 |
51 |
1 |
p. 108-114 |
article |
5 |
A scanning probe microscope for studying electron transport at low temperatures
|
Zhukov, A. A. |
|
2008 |
51 |
1 |
p. 130-134 |
article |
6 |
A spectropolarimeter for studying solar magnetic fields
|
Kolobov, D. Yu. |
|
2008 |
51 |
1 |
p. 124-129 |
article |
7 |
A starting device for a metal plasma source
|
Grigor’ev, A. N. |
|
2008 |
51 |
1 |
p. 135-136 |
article |
8 |
A study of a short-term instability and aging of ΦЭУ-115M photomultiplier tubes
|
Evdokimov, V. N. |
|
2008 |
51 |
1 |
p. 89-95 |
article |
9 |
A technique for evaluating the pulse breakdown voltage in vacuum
|
Emel’yanov, A. A. |
|
2008 |
51 |
1 |
p. 115-118 |
article |
10 |
A technique for measuring an adsorption-induced deformation
|
Shkolin, A. V. |
|
2008 |
51 |
1 |
p. 150-155 |
article |
11 |
A thin-film resistive sensor for measuring atomic hydrogen flux density
|
Kagadei, V. A. |
|
2008 |
51 |
1 |
p. 142-146 |
article |
12 |
Calibration of the scintillation trigger detector of the forward muon system for the D0 experiment
|
Bezzubov, V. A. |
|
2008 |
51 |
1 |
p. 34-43 |
article |
13 |
Highly sensitive micropixel avalanche photodiodes for scintillation counters of the T2K neutrino experiment
|
Musienko, Yu. V. |
|
2008 |
51 |
1 |
p. 101-107 |
article |
14 |
400-kV trigatrons for high-power low-inductance pulse generators
|
Boyko, N. I. |
|
2008 |
51 |
1 |
p. 70-77 |
article |
15 |
Measurements of the solidification point of the GKGh-136 silicone liquid
|
Buravov, L. I. |
|
2008 |
51 |
1 |
p. 156-157 |
article |
16 |
Measuring the lithium layer thickness
|
Bayanov, B. F. |
|
2008 |
51 |
1 |
p. 147-149 |
article |
17 |
Measuring the magnetic parameters of the multipole magnets for the specialized MLS source of synchrotron radiation
|
Batrakov, A. M. |
|
2008 |
51 |
1 |
p. 119-123 |
article |
18 |
Measuring the thickness of dead layers in semiconductor detectors
|
Gurov, Yu. B. |
|
2008 |
51 |
1 |
p. 59-63 |
article |
19 |
Methods for narrow-band-interference compensation based on symmetry of desired-signal spectra
|
Pakhotin, V. A. |
|
2008 |
51 |
1 |
p. 64-69 |
article |
20 |
Precise measurements of collision parameters of spectral lines with a spectrometer with radioacoustic detection of absorption in the millimeter and submillimeter ranges
|
Tretyakov, M. Yu. |
|
2008 |
51 |
1 |
p. 78-88 |
article |
21 |
Registration of optical resonances without distorting their shapes
|
Dmitriev, A. K. |
|
2008 |
51 |
1 |
p. 96-100 |
article |
22 |
The CORSET time-of-flight spectrometer for measuring binary products of nuclear reactions
|
Kozulin, E. M. |
|
2008 |
51 |
1 |
p. 44-58 |
article |