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                             7 results found
no title author magazine year volume issue page(s) type
1 A model-based clustering approach to the recognition of the spatial defect patterns produced during semiconductor fabrication Yuan, Tao
2008
40 2 p. 93-101
article
2 An economic comparison of CUSUM and Shewhart charts Nenes, George
2008
40 2 p. 133-146
article
3 Holistic reliability analysis of weighted voting systems from a multi-state perspective Ramirez-Marquez, Jose Emmanuel
2008
40 2 p. 122-132
article
4 Optimal specifications for degrading characteristics Joseph, V. Roshan
2008
40 2 p. 102-108
article
5 Probability and Random Processes Krishnan, V.
2008
40 2 p. 160
article
6 Simultaneous optimization of X¯ control chart and age-based preventive maintenance policies under an economic objective Yeung, Thomas G.
2008
40 2 p. 147-159
article
7 Variability monitoring of multistage manufacturing processes using regression adjustment methods Zeng, Li
2008
40 2 p. 109-121
article
                             7 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands